Iskandar JW, Nataliani Y. Perbandingan Naïve Bayes, SVM, dan k-NN untuk Analisis Sentimen Gadget Berbasis Aspek : Comparison of Naïve Bayes, SVM, and k-NN for Aspect-Based Gadget Sentiment Analysis. J. RESTI (Rekayasa Sist. Teknol. Inf.) [Internet]. 2021 Dec. 30 [cited 2026 Oct. 29];5(6):1120-6. Available from: https://jurnal.iaii.or.id/index.php/RESTI/article/view/3588